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114-1 Mini Courses 專業領域微課程
114-1 Mini Courses 專業領域微課程
Notes:
· This category consists of micro-courses in professional fields. For graduation credit recognition, please confirm with your departmental office after completing three courses as a set (equivalent to 1 credit).
· Micro-credit courses offered by this Center are conducted in accordance with the National Chung Hsing University Guidelines for Micro-Courses in Professional Fields (2023/10/25).
· Equipment License Requirements (For example, applying for an SEM/AFM license requires the completion of both SEM/AFM (I & II) courses and 10 hours of observation/practice. The license application fee is NTD 500.)
注意事項：
*此類別為專業領域之微學分課程，畢業學分採計，請於修習完3門為一組後(即1學分)，向各自系所系辦確認。
*本中心開設之微學分課程，依據《國立中興大學專業領域微課程實施要點（1121025）》規定辦理。
*若需取得設備使用執照，需另行遵守規範。（例如，SEM/AFM 等設備的執照申請需同時完成 SEM/AFM (I, II) 課程並完成見習/實習 10 小時。執照申請費用為 500 NTD。）
核心設施簡介 不限科系皆可選修
實作課程
English-taught course(s)
Notes:
· This category consists of micro-courses in professional fields. For graduation credit recognition, please confirm with your departmental office after completing three courses as a set (equivalent to 1 credit).
· Micro-credit courses offered by this Center are conducted in accordance with the National Chung Hsing University Guidelines for Micro-Courses in Professional Fields (2023/10/25).
· Equipment License Requirements (For example, applying for an SEM/AFM license requires the completion of both SEM/AFM (I & II) courses and 10 hours of observation/practice. The license application fee is NTD 500.)
注意事項：
*此類別為專業領域之微學分課程，畢業學分採計，請於修習完3門為一組後(即1學分)，向各自系所系辦確認。
*本中心開設之微學分課程，依據《國立中興大學專業領域微課程實施要點（1121025）》規定辦理。
*若需取得設備使用執照，需另行遵守規範。（例如，SEM/AFM 等設備的執照申請需同時完成 SEM/AFM (I, II) 課程並完成見習/實習 10 小時。執照申請費用為 500 NTD。）
核心設施簡介 不限科系皆可選修
| 課程名稱 Course | 開課日期Date & Link 報名連結 | 備 註 Notes |
| 跨域半導體核心設施簡介 Introduction to Disciplinary Semiconductor Core Facilities. | 1.任選一日期報名 2. 不限科系 |
實作課程
| 課程名稱 Course | 開課日期 Date & Link 報名連結 | 備 註 Notes |
| 半導體儀器分析之場發射顯微鏡檢測分析實作課程(SEM I) Hand-on Course on Field Emission Microscopy Detection and Analysis in Semiconductor Instrumentation | (Mon.) 0908 1013 1103 1201 | 1.全日課程 9:00~12:00, 14:00~17:00 2.可單獨報名 3.任選一日期報名 4.中文課程 |
| 高階半導體設施實作課程 I (SEM II) Advanced Semiconductor Facilities Hands-on Course I | (Tue.) 0909 1014 1104 1202 | 1.全日課程 9:00~12:00, 14:00~17:00 2.需同時報名 (I, II) 並完成相關課程。 3.任選一日期報名 4.中文課程 |
| 半導體儀器分析之高解析度穿透式電子顯微鏡檢測分析實作課程(TEM) Hands-on Course on High-Resolution Transmission Electron Microscopy Detection and Analysis in Semiconductor Instrumentation | 10/06(En.) 1023 | 1.任選一日期報名 2. 中文課程 |
| 半導體儀器分析之掃描探針顯微鏡檢測分析實作課程 (AFM I) Hands-on Course on Scanning Probe Microscopy Detection and Analysis in Semiconductor Instrumentation | (Wed.) 0910 1015 1105 1203 | 1.全日課程 9:00~12:00, 14:00~17:00 2. 可單獨報名 3.任選一日期報名 4.中文課程 |
| 高階半導體設施實作課程 II (AFM II) Advanced Semiconductor Facilities Hands-on Course II | (Thu.) 0911 1016 1106 1204 | 1.全日課程 9:00~12:00, 14:00~17:00 2. 需同時報名 (I, II) 並完成相關課程。 3.任選一日期報名 4.中文課程 |
| 半導體儀器分析之共軛焦拉曼光譜儀分析實作課程 Hands-on Course on the analysis of semiconductor instruments using confocal Raman spectroscopy. | (Fri.) 0912 1017 1107 1205 | 1.任選一日期報名 2.中文課程 |
| 課程名稱 Course | 開課日期 Date & Link 報名連結 | 備 註 Notes |
| 半導體儀器分析之雙束型聚焦離子束系統實作課程 Hands-on Course on Dual Beam Focused Ion Beam System in Semiconductor Instrumentation | 10月 | 1.任選一日期報名 2. 中文課程 |
| 半導體儀器分析之雷射直寫式黃光微影製作圖案化半導體實作課程 Hands-on Course on Laser Direct Write Lithography for Patterning Semiconductors in Semiconductor Instrumentation. | 1015 | 1.任選一日期報名 2. 中文課程 |
| X光繞射分析於半導體產業之應用實作課程 Hands-on Course on X-ray diffraction analysis in the semiconductor industry | 10月 11/03(En.) | 1.任選一日期報名 2. 中文課程 |
| 應用化學分析電子能譜儀在半導體製程之分析 Application of chemical analysis using Electron Spectroscopy for Chemical Analysis (ESCA) in semiconductor processing. | 1008 10/17(En.) | 1.任選一日期報名 2. 中文課程 |
| 高解析質譜分析之半導體材料不純物檢測分析實作課程 Hands-on Course on impurity detection and analysis of semiconductor materials using high-resolution mass spectrometry. | 1016 | 1.任選一日期報名 2. 中文課程 |
| 以紅外線光譜與電子順磁共振儀檢測半導體表面有機物殘存與晶格缺陷實作課程 Practical Course on Detecting Organic Residues and Lattice Defects on Semiconductor Surfaces Using Infrared Spectroscopy and Electron Paramag-netic Resonance | 1009 | 1.任選一日期報名 2. 中文課程 |
| 高階半導體設施實作課程（III）(碩) (Mass) Advanced Semiconductor Facilities Hands-on Course III | 1016 | 1.任選一日期報名 2. 中文課程 |
English-taught course(s)
| 課程名稱Course | 開課日期 Date & Link 報名連結 | 備 註 Notes |
| 半導體儀器分析之場發射顯微鏡檢測分析實作課程 sem 1 Hand-on Course on Field Emission Microscopy Detection and Analysis in Semiconductor Instrumentation | 9/15 10/20 11/10 12/08 | 1.English-taught 2.Enrollment in both (I, II) is required |
| 高階半導體設施實作課程 I sem 2 Advanced Semiconductor Facilities Hands-on Course I | 9/16 10/21 11/11 12/09 | 1.English-taught 2.Enrollment in both (I, II) is required |
| 半導體儀器分析之掃描探針顯微鏡檢測分析實作課程 afm 1 Hands-on Course on Scanning Probe Microscopy Detection and Analysis in Semiconductor Instrumentation | 9/17 10/22 11/12 12/10 | 1.English-taught 2.Enrollment in both (I, II) is required |
| 高階半導體設施實作課程 II afm 2 Advanced Semiconductor Facilities Hands-on Course II | 9/18 10/23 11/13 12/11 | 1.English-taught 2.Enrollment in both (I, II) is required |
| 半導體儀器分析之共軛焦拉曼光譜儀分析實作課程程 Hands-on Course on the analysis of semiconductor instruments using confocal Raman spectroscopy. | 9/19 10/24 11/14 12/12 | English-taught |
